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日本NAPSON探头TC-150-100-1mm TC-40u OS-200u, 500u
发布时间:2026-03-30

日本NAPSON探头TC-150-100-1mm TC-40u OS-200u, 500u


日本NAPSON探头TC-150-100-1mm TC-40u OS-200u, 500u

4 point probe head
Cartridge type, Cylindrical type, Miniature type, Cartridge with 6-way connector socket type

  • 4 point probe head

Features

Napson 4 point resistivity / sheet resistance systems are using high performance probe heads which are made by Jandel Engineering Limited of England.

Jandel probe head performs high precise measurement of resistivity and sheet resistance for silicon wafers, epitaxial layers, diffusion layers, ITO layers, metal layers and more, so that Jandel probes have a good evaluation for many years.

  • *Load (needle pressure) is always suitable since using V type spring

  • *Probe spacing accuracy and probe stability is excellent since anodized aluminum alloy upper and lower guides are jeweled

  • *Less damage of probe needle tips – Solid tungsten carbide needles for superior durability

Details

Applications

The probe type is chosen under the material of measuring sample, the surface state, the form etc.

Measurement sampleProbe head
(Material/Radius)
Load/Needle
Silicon Ingots / BlockTC-40u200g
Silicon SliceTC-40u200g
Epitaxial LayersTC-150u100g
Epitaxial Layers (Thin film)TC-150u, 500u50g
Shallow Diffused -layers (Thin film)OS-200u, 500u50g
Diffused LayersOS-200u, TC-150u100g
Ion ImplantationTC-150u50g, 100g
Metal (Thin film)TC-150u, 500u25g, 50g, 100g
ITO layerTC-150u, 500u25g, 50g, 100g
  • The other types are available.

  • If you would like to have a special spec, contact us.

〈Specifications〉
e.g) TC-40u-200g/1.00mm

  • Needle Material: TC [Tungsten carbide] (or OS: Osmium alloy)

  • Radius: 40 um (25 um to 500 um)

  • Loads (g/needle): 200g (10g to 250g)

  • Spacing: 1.00 mm (0.5 mm to 1.59 mm)

  • Arrangement: Linear (standard) (Square is available)